{{numberOfItems}}
14196 resultaten gevonden

Nanometer-scale Defect Detection Using Polarized Light

Philippe Pougnet ; Abdelkhalak El Hami ; Pierre-Richard Dahoo

In winkelmandje Details

Strategor - English version

João Albino-Pimentel ; Rodolphe Durand ; Pierre Dussauge ; Laurence Lehmann-Ortega

In winkelmandje Details

Applications and Metrology at Nanometer-Scale 2

Pierre-Richard Dahoo ; Philippe Pougnet ; Abdelkhalak El Hami

In winkelmandje Details

Treachery and Forbidden Passion – 3 Classic Novels

Aphra Behn ; Pierre Choderlos de Laclos ; Charles Garvice ; Innis Carr

In winkelmandje Details
pro-mbooks3 : libris