14196 resultaten gevonden

Nanometer-scale Defect Detection Using Polarized Light

Philippe Pougnet ; Abdelkhalak El Hami ; Pierre-Richard Dahoo

Strategor - English version

João Albino-Pimentel ; Rodolphe Durand ; Pierre Dussauge ; Laurence Lehmann-Ortega

Applications and Metrology at Nanometer-Scale 2

Pierre-Richard Dahoo ; Philippe Pougnet ; Abdelkhalak El Hami

Treachery and Forbidden Passion – 3 Classic Novels

Aphra Behn ; Pierre Choderlos de Laclos ; Charles Garvice ; Innis Carr

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